Explore the fundamental principles of atomic force microscopy through this comprehensive 12-hour course developed by Professors Ron Reifenberger and Arvind Raman. Master the underlying physics and operational mechanisms of AFM technology through five structured modules covering tip-surface interactions in both non-contact and contact modes, including intramolecular forces, electric dipoles, physical models, ion-dipoles, Keesom forces, and dispersion forces. Examine contact mechanics principles including Hamaker constants, surface energies, Derjaguin approximation, material elasticity, and Hertz, JKR, and DMT models. Learn about AFM instrumentation components, calibration procedures, contact mode scanning techniques, and system-level understanding including water meniscus effects and VEDA simulation software. Develop expertise in force spectroscopy methods including force sensor operation, approach curve analysis, jump-to-contact phenomena, force curve processing, modulus and adhesion mapping, and lateral force microscopy techniques. Apply theoretical knowledge through hands-on computer simulations using VEDA software to analyze force-distance relationships, contact mode scanning procedures, feedback mechanisms, and image artifact identification, providing essential knowledge for understanding AFM operation and applications in nanoscale characterization.

Syllabus

nanoHUB-U Fundamentals of AFM L1.1: Tip-Surface Interactions (Non-Contact) - IntraMolecular
nanoHUB-U Fundamentals of AFM L1.2: Tip-Surface Interactions (Non-Contact) - Electric Dipoles
nanoHUB-U Fundamentals of AFM L1.3: Tip-Surface Interactions (Non-Contact) - Physical Models
nanoHUB-U Fundamentals of AFM L1.4: Tip-Surface Interactions (Non-Contact) - Ion-Dipoles
nanoHUB-U Fundamentals of AFM L1.5: Tip-Surface Interactions (Non-Contact) - Keesom Force
nanoHUB-U Fundamentals of AFM L1.6: Tip-Surface Interactions (Non-Contact) - Dispersion Force
nanoHUB-U Fundamentals of AFM L2.1: Tip-Surface Interactions (Contact) - Hamaker
nanoHUB-U Fundamentals of AFM L2.2: Tip-Surface Interactions (Contact) - Surface Energies
nanoHUB-U Fundamentals of AFM L2.3: Tip-Surface Interactions (Contact) - Dejaugin Approximation
nanoHUB-U Fundamentals of AFM L2.4: Tip-Surface Interactions (Contact) - Elasticity of Materials
nanoHUB-U Fundamentals of AFM L2.5: Tip-Surface Interactions (Contact) - Contact Mechanics
nanoHUB-U Fundamentals of AFM L2.6: Tip-Surface Interactions (Contact) - Hertz, JKR, DMT
nanoHUB-U Fundamentals of AFM L3.1: AFM-The Instrument - The Water Meniscus
nanoHUB-U Fundamentals of AFM L3.2: AFM-The Instrument - Introduction to VEDA
nanoHUB-U Fundamentals of AFM L3.3: AFM-The Instrument - AFM Components
nanoHUB-U Fundamentals of AFM L3.4: AFM-The Instrument - AFM Calibrations
nanoHUB-U Fundamentals of AFM L3.5: AFM-The Instrument - Contact Mode Scans
nanoHUB-U Fundamentals of AFM L3.6: AFM-The Instrument - The AFM as a System
nanoHUB-U Fundamentals of AFM L4.1: Force Spectroscopy - The Force Sensor
nanoHUB-U Fundamentals of AFM L4.2: Force Spectroscopy - The Approach Curve
nanoHUB-U Fundamentals of AFM L4.3: Force Spectroscopy - Jump to Contact
nanoHUB-U Fundamentals of AFM L4.4: Force Spectroscopy - Processing Force Curves
nanoHUB-U Fundamentals of AFM L4.5: Force Spectroscopy - Modulus and Adhesion Maps
nanoHUB-U Fundamentals of AFM L4.6: Force Spectroscopy - Lateral Force Microscopy (LFM)
nanoHUB-U Fundamentals of AFM L5.1: Computer Simulations using VEDA - Force-Distance I
nanoHUB-U Fundamentals of AFM L5.2: Computer Simulations using VEDA - Force-Distance II
nanoHUB-U Fundamentals of AFM L5.3: Computer Simulations using VEDA - Contact Mode Scanning I
nanoHUB-U Fundamentals of AFM L5.4: Computer Simulations using VEDA - Contact Mode Scanning II
nanoHUB-U Fundamentals of AFM L5.5: Computer Simulations using VEDA - Contact Mode Feedback
nanoHUB-U Fundamentals of AFM L5.6: Computer Simulations using VEDA - Image Artifacts