Watch a technical presentation from PLVision leaders exploring how artificial intelligence and machine learning can revolutionize Switch Abstraction Interface (SAI) testing methodologies. Learn about the current challenges in SAI testing, where only approximately 50% of over 1000 functional points are being tested, and discover proposed solutions for implementing AI/ML algorithms to improve test coverage. Gain valuable insights into how ASIC vendors and OEMs can benefit from automated testing processes that enhance efficiency, reliability and accelerate product development cycles. The 18-minute talk, delivered by Director of Open Networking Solutions Taras Chornyi and CTO Leonid Khedyk, provides a roadmap for transforming SAI testing practices through emerging technologies.