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Force-Measuring Techniques: Direct and Indirect Measurements

NPTEL-NOC IITM via YouTube

Overview

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This lecture explores both direct and indirect force measurement techniques, covering peeling force, adhesion force, and their applications in polymer films for semiconductor devices, lubrication layers, and foam films. Learn about specialized equipment used for precise force measurements, including the Surface Force Apparatus (SFA) and Atomic Force Microscope (AFM), and understand how these techniques are applied in various scientific and engineering contexts.

Syllabus

Force-measuring techniques: Direct and indirect measurements

Taught by

NPTEL-NOC IITM

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