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Big Strides in Electronics Test and Production - From Algorithmic Methods to Unsupervised Machine Learning

MEPTEC via YouTube

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Overview

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Learn about the significant advancements in electronics testing and production through a 30-minute MEPTEC conference talk exploring the evolution from algorithmic approaches to unsupervised machine learning techniques in semiconductor manufacturing and quality control.

Syllabus

Big strides in electronics test and production using algorithmic methods to unsupervised ML

Taught by

MEPTEC

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