BadUSB-C - Revisiting BadUSB with Type-C

Explore the evolution of BadUSB attacks in this 20-minute IEEE conference talk from the 15th IEEE Workshop on Offensive Technologies. Delve into the research conducted by Hongyi Lu, Shuqing Li, You Lin, Chaozu Zhang, Yechang Wu, and Fengwei Zhang from Southern University of Science and Technology as they revisit the BadUSB concept with USB Type-C technology. Gain insights into potential security vulnerabilities associated with USB-C devices and learn about the implications for cybersecurity professionals and device manufacturers. Understand the latest developments in USB-based attacks and their potential impact on modern computing systems.