AI-Based Wafer Defect Detection Using Anomaly Detection - Real-Time Implementation

Learn about rapid and accurate wafer defect detection in this 20-minute conference talk from SK TECH SUMMIT 2023. Explore the growing field of Industrial Anomaly Detection with AI technology, focusing on handling imbalanced data in production environments where defects are rare. Discover unsupervised and semi-supervised learning techniques for achieving efficient anomaly detection and segmentation, along with ensemble model approaches for maintaining robust performance. Follow SK Hynix's Kuk-il Cho, a Data Scientist with extensive experience as a process engineer and IT developer, as he shares insights on implementing a real-time wafer surface defect detection system. Benefit from his comprehensive expertise in domain knowledge, IT development, and data analysis, backed by patents, hackathon victories, and academic achievements in Data Science.