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Metal-In Test-Driven Development: A Dual-Target TDD Approach for Embedded Systems

NDC Conferences via YouTube

Overview

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Watch a conference talk from NDC TechTown that explores an innovative approach to Test-Driven Development for embedded systems. Learn how to overcome hardware bottlenecks and decouple embedded code from underlying hardware using the Metal-In TDD methodology, a specific implementation of Dual-Target TDD. Through a practical battery monitor module example, discover the iterative process of first touching the metal to "Make-It-Work," then driving the code inward to "Make-It-Right." Explore techniques for creating decoupled, portable entities and business domain models while utilizing automated refactoring tools for C/C++. Follow along as the speaker demonstrates how to develop embedded systems more efficiently by minimizing hardware dependencies in the development workflow, all while maintaining safe and incremental progress through test-driven practices.

Syllabus

Metal-In Test-Driven Development: A Dual-Target TDD approach - Fran Climent - NDC TechTown 2024

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NDC Conferences

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