Explore techniques for reducing driver attack surfaces in embedded devices through IRQDebloat. Delve into the challenges of binary analysis and fuzzing in this IEEE conference talk. Learn about the innovative IRQ fuzzing approach, its workflow, and implementation details. Examine the evaluation process, including trace analysis correctness, fuzzing coverage, and attack surface reduction. Gain insights into improving embedded device security and mitigating potential vulnerabilities in driver code.

Syllabus

Intro
The Good & The Bad
Challenges: Binary Analysis
Challenges: Fuzzing Challenge
IRQ Fuzzing
Workflow
Implementation Details
Evaluation
Trace Analysis Correctness
Fuzzing Coverage
Attack Surface Reduction
Conclusions