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Explore advanced techniques in scanning transmission electron microscopy (STEM) for solving 3D nanostructures through atomic electron tomography (AET) in this 57-minute lecture. Delve into the limitations of traditional annular dark field (ADF) imaging and discover how multi-dimensional imaging channels can overcome these constraints. Learn about chemical information recovery using energy dispersive x-ray (EDX) mapping and electron energy loss spectroscopy (EELS), and understand the potential of combining these measurement channels with multi-modal sensor fusion and modern computational imaging methods. Investigate the use of fast direct electron detectors for ptychographic imaging, enabling extremely dose-efficient reconstructions and improved spatial and angular resolution. Examine a case study solving the structure of a complex ZrTe nanowire embedded in a double-walled carbon nanotube, and discuss the development of a general reconstruction framework incorporating multiple simultaneous measurement channels.
