Learn the fundamental principles and practical applications of chemical crystallography through this comprehensive course covering X-ray diffraction theory, crystal systems, and structure determination methods. Master the basics of crystallographic symmetries, Bravais lattices, and point groups while developing skills in stereographic projections and space group analysis. Explore X-ray sources, diffractometers, and detection systems used in modern crystallographic research. Gain hands-on experience with powder and single crystal X-ray diffraction techniques, including data collection, reduction, and processing using industry-standard software packages like Olex 2 and Apex II. Study structure factor calculations, electron density mapping, and systematic absence conditions for determining crystal structures. Practice solving the phase problem using Patterson and direct methods, and learn advanced techniques for handling disorders in crystal structures. Examine practical crystallization methods and their applications in determining ceramic and cubic structures. Work with the Cambridge Structure Database and understand its role in crystallographic research. Develop proficiency in structure refinement techniques and learn to interpret diffraction data for accurate structural determination. Apply theoretical concepts through tutorials and laboratory exercises that reinforce understanding of Bragg's law, reciprocal lattice theory, and Miller indices for crystallographic planes and directions.

Syllabus

Introduction to X-Ray Crystallography
Sources of X-Rays, Crystal Systems and Bravais lattices
3 Crystallographic Symmetries
Equivalent Points and 1D Lattices
5 Five Fold Symmetry and 2D Lattices
6 2D Space Lattices
7 Crystallographic Point Groups
8 Stereographic Projecitons of Point Groups
9 Understanding of Crystallographic Space Groups
10 2D Projection of Space Groups
Tutorial 1
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Powder X-Ray Diffractometer -Lab
Powder X-Ray Diffractometer -Theory
Sigma 1 and Triplet Relationship
Phase Problem
Identification from Intensity Statistics the presence of 2 fold axis in Lattice
Identification from Intensity Statistics the Correct Crystal System and Presence of Inversion Center
Data Reduction- Scale and Temperature Factor
Data Reduction-Lorentz and Polarization Correction
Data Reduction-Absorption Correction
Cambridge Structure Database and its Application
Disorder Treatment using Olex 2
Disorders in Crystal Structures
Structure Solution using Olex 2 (Rigaku Diffractometer)
Patterson Method
Direct Methods - Part 02
Direct Methods - Part 01
Structure Solution using Apex II (Bruker Diffractometer)
Data Handling (Solution and Refinement) using Various Crystallographic Packages
Understanding the X-Ray Data
Single Crystal X-Ray Diffractometer
Structure Refinement
Systematic Absence Conditions from Special Structure Factor Expression
Structure Fcator and Electron Density
Derivation of Friedel's Law from Structure Factor by Vector Space Diagram
Experimental Methods and Theoretical Understanding of X-Ray Diffraction
Laue's and Bragg's Analysis
Diffractometers and Detectors
Diffractometers
Single Crystal X-Ray Diffraction Data Collection
Tutorial
Special Method of Crystallisation
Systematic Absences and Crystallisation Methods
Bragg's Law in Reciprocal Lattice and Origin of Systematic Absences
Origin of Reciprocal Lattice
Representation of Orthorhombic and Tetragonal Space Groups
Miller Indices for Crystallographic Directions and Planes
Tutorial 3
Theory of X-Ray Diffraction
Ceramic Structures
Tutorial 2
Cubic Structues and atomic packing factors
15 Miller Indices and Planar Densities
12 Obtaining Equivalent points
11 3D Space Groups and Equivalent Points
Systematic absence conditions from special structure factor expression