A Novel Testing Framework for Radiation Qualification of Commercial Microelectronics

Learn about developing a comprehensive testing framework for evaluating commercial microelectronics components for space applications in this 19-minute conference talk. Explore the challenges of adapting off-the-shelf components like the FTLX8574D3BCV Multimode 10G SFP+ optical transceiver for use in harsh space environments, where ionizing radiation and charged particles pose significant threats to electronic systems. Discover innovative shielding approaches that combine high atomic-number materials such as tungsten for gamma radiation protection with boron-containing layers for neutron moderation, potentially reducing overall shielding mass compared to existing designs. Examine preliminary research findings that demonstrate how this novel testing protocol could enable high-speed data transmission with low bit error rates in space vehicles while addressing stringent weight and size constraints. Understand the cost-effective benefits of qualifying commercial components for space use, including reduced testing expenses and accelerated qualification timelines that are crucial for the rapidly expanding space industry. Gain insights into microelectronics reliability testing methodologies and their practical applications in aerospace engineering from research conducted at Purdue University.