UnTrustZone: Systematic Accelerated Aging to Expose On-Chip Vulnerabilities

Explore a cutting-edge IEEE conference talk on systematic accelerated aging techniques for exposing vulnerabilities in on-chip systems. Delve into the innovative "UnTrustZone" approach presented by Jubayer Mahmod, which aims to uncover potential security weaknesses in integrated circuits. Learn about the methodology, implementation, and implications of this accelerated aging process for enhancing hardware security and reliability testing.