Advanced Material Characterization by Atom Probe Tomography and Electron Microscopy

Week 1: Introduction to field ion microscopy (FIM) Theory of field ionization, “Atoms” in FIM, spatial resolution of FIM, FIM images
Week 2:Atom Probe tomography, Theory of field evaporation, Atoms one-by-one: Tomography
Week 3:Instrumental setup, Pulsing technique – HV, Laser, Experimental details, Specimen alignment, detection of ions, Mass spectra, mass resolution, common artefacts
Week 4:Elemental identification, compositional measurement, detectability
Week 5:Flight path, pulse fraction, selection of pulsing mode, pulsing rate, detection rate
Week 6:Tomographic reconstruction, Projection of ions Electric field, Ion trajectories, models, Fundamentals of reconstruction protocol, Calibration of reconstruction – techniques, Artefacts, Spatial and depth resolution.
Week 7:Sample Preparation, Electro-polishing Chemical polishing, Focused Ion-beam techniques, Influence of specimen geometry on data
Week 8:Application to Materials Science with practical examples, Concentration analysis, Visualization techniques, 1-D concertation and density profiles, Ladder diagrams
Week 9:2-D composite maps, Proximity histogram, Radial Distributions functions, Spatial distribution maps, APT crystallography
Week 10:Correlative electron microscopy and atom probe tomography, Introduction to electron channeling patterns and electron channeling contrast imaging in SEM
Week 11:Introduction to Transmission Kikuchi Diffraction (TKD) in SEM, Introduction to basic diffraction methods and high-resolution imaging in transmission electron microscope (including STEM imaging)
Week 12:Corelative sample preparation techniques, Correlative methods that include electron microscopy techniques in conjunction with atom probe tomography