JTAG Fault Analysis: Journey to Unlocking Automotive Grade ICs
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Explore a 28-minute Black Hat conference talk detailing the security vulnerability discovery in automotive-grade ICs through JTAG interface exploitation. Dive into the research team's analysis of the SPC5 chip's JTAG protocol, commonly used in automotive security and safety-critical controllers. Learn how researchers reverse-engineered the JTAG password authentication process, designed specialized hardware to bypass redundant checks, and successfully breached security through voltage fault injection. Understand the broader implications of this vulnerability across the SPC5 series chips and potentially other vendors' products. Gain crucial insights into why critical automotive applications should not solely rely on JTAG protection, presented by an expert team of researchers from GoGoByte, CATARC, China Merchants Testing Vehicle Technology Research Institute, and leading academic institutions including Zhejiang University and the University of Electronic Science and Technology of China.
Syllabus
Ops! It is JTAG's Fault: Journey to Unlocking Automotive Grade IC
Taught by
Black Hat